The transaction is expected to provide revenue synergies by leveraging Onto Innovation’s broader access to global markets, especially in Asia. The transaction purchase price represents 1.4x Inspectrology’s 2020 revenue of approximately $20 million.
Inspectrology, a leading supplier of overlay metrology for controlling lithography and etch processes in the compound semiconductor market, was acquired by Onto Innovation. The transaction is expected to provide revenue synergies by leveraging Onto Innovation’s broader access to global markets, especially in Asia. The Inspectrology team will be able to leverage Onto Innovation’s R&D resources and larger customer support organization to better serve its customers.
“This is a nice strategic fit for Onto Innovation’s portfolio of solutions for the high growth specialty and advanced packaging segment. We see revenue synergies by leveraging our broader access to global markets, especially in Asia, where Onto Innovation has built a broad infrastructure to support our leading position in inspection for this segment. In addition, we see revenue synergies when combined with Onto Innovation’s inspection and software technologies. By combining these technologies, we will offer a more comprehensive process control solution for the lithography cell in the rapidly expanding compound semiconductor market,” said Mike Plisinski, Onto Innovation’s CEO.
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Dr. Ju Jin, Vice President and General Manager of Onto Innovation’s inspection business said, “We see several growth drivers for the compound semiconductor and specialty semiconductor markets in 2021 and beyond. The rapidly expanding 5G wireless technology, spanning from smartphones and IoT to network equipment and base stations, is increasing the demand for compound semiconductor chips such as power amplifiers, RF filters, and mmWave cells. In addition, hybrid and electric vehicles, chargers, photovoltaic and wind power generators are driving the fast adoption of compound semiconductor power devices.”
Inspectrology was advised by Microtech Ventures, Inc., in pursuing and executing the transaction. Paul Knutrud, Inspectrology’s CFO and Vice President said, “Microtech Ventures was key to our M&A process and conducted a comprehensive process to identify the best corporate strategic partner for us in Onto Innovation. Their guidance was essential to successfully completing the transaction.”
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Paul Knutrud also cited strong cultural fit and synergies between the companies, “As leading suppliers for overlay and CD metrology systems to the compound semiconductor, RF, MEMS, and LED markets, Onto Innovation and Inspectrology are a perfect fit.”
Dr. Mike Pinelis, President and CEO of Microtech Ventures said, “We are glad to bring Onto Innovation and Inspectrology together in this deal. As part of this project, we had detailed discussions with 48 companies in the inspection and metrology market segment, and Onto Innovation was the best match for Inspectrology. We see strong strategic synergies and significant growth opportunity for Inspectrology within the Onto Innovation organization.”
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