Artificial Intelligence | News | Insights | AiThority
[bsfp-cryptocurrency style=”widget-18″ align=”marquee” columns=”6″ coins=”selected” coins-count=”6″ coins-selected=”BTC,ETH,XRP,LTC,EOS,ADA,XLM,NEO,LTC,EOS,XEM,DASH,USDT,BNB,QTUM,XVG,ONT,ZEC,STEEM” currency=”USD” title=”Cryptocurrency Widget” show_title=”0″ icon=”” scheme=”light” bs-show-desktop=”1″ bs-show-tablet=”1″ bs-show-phone=”1″ custom-css-class=”” custom-id=”” css=”.vc_custom_1523079266073{margin-bottom: 0px !important;padding-top: 0px !important;padding-bottom: 0px !important;}”]

Advantest’s New High-Productivity Memory Tester Integrates Burn-In and Memory-Cell Test Functions in One System

New H5620 Tester Designed to Address the Global Market’s Rapidly Growing Demand for DDR DRAM Units

Leading semiconductor test equipment supplier Advantest Corporation has introduced its new versatile, high-throughput H5620 memory tester that combines the capabilities to perform both burn-in and memory-cell testing for advanced DRAMs and LPDDR (low-power, double-data-rate) devices.

With the advent of 5G technology, worldwide DRAM bit-based consumption is expected to approximately double by 2023. This increase is being driven primarily by growth in the data-processing and mobile-communication market segments, with data centers requiring more memory and smart-phone functionality expanding to include higher resolution, foldable capability and multi-camera designs. As the average selling prices for memory ICs continue to shrink, semiconductor manufacturers need ways to reduce testing costs while increasing production volumes.

Recommended AI News: Publix Offering Rent Relief in Publix-owned Shopping Centers

Advantest’s newest tester helps to accomplish this with its superior efficiency. In production environments, the H5620 can test over 18,000 devices in parallel at 100-MHz frequencies and data rates up to 200 Mbps. It is adaptable for factory automation and supports a wide temperature range of -10° C to 150° C with a dual-chamber structure featuring individual thermal-control stability.

Related Posts
1 of 40,399

In addition, the new system can reduce customers’ capital expenditures and save floor space by combining legacy memory-cell testing with the burn-in test process in memory production facilities.

“By delivering high productivity at a low cost of test, this memory tester raises the bar for evaluating today’s newest DRAMs,” said Takeo Miura, vice president of the Memory ATE Business Group at Advantest.

Recommended AI News: BigSpring Announces Sudha Bala as Vice President, Customer Success and Luke McNeal as Vice President, Sales

The H5620 runs on the FutureSuite operating system with its versatile tool set. This software ensures that the tester can be easily integrated with legacy memory test systems from Advantest. In addition, assistance with program coding, debugging, correlation and maintenance is available from Advantest’s global support network.

The new H5620 tester has begun shipping to customers and the H5620ES engineering model will be ready by the second quarter of this calendar year.

Comments are closed, but trackbacks and pingbacks are open.