Park Systems Announces Park SmartAnalysis Next-generation Image Analytics Software for Atomic Force Microscopy
Park Systems, world-leading manufacturer of Atomic Force Microscopes announces Park SmartAnalysis, a next-gen image processing and data analysis software is now available for all Park AFM’s featuring advanced image processing capabilities.
SmartAnalysis provides various tools to analyze, measure, and perform statistics from the AFM image and data, that speeds the analytics process including EZ Flatten which provides multiple output images using a deep learning system that eliminates artifacts.
“Using SmartAnalysis in tandem with Park AFM combines the strength of Park’s superior hardware technology with the software platform designed to enhance user experience and drive success in the publishing process of data reporting,” states Arthur Choi, VP of SW R&D center at Park Systems.
The advanced Imaging features of SmartAnalysis includes:
- Precise image analysis via multi-layer and line function
- Effortless image processing with EZ Flatten producing optimal images
- High-quality 2D, 3D images, histogram, and region statistics analysis
- Image export and publishing without degrading the image resolution
Park Systems offers a complete line of AFM systems with advanced imaging modes that meet the application requirements of technology researchers. Park’s products address the most pressing issues in materials science, EV electronics, failure analysis including advanced defect inspection methods, chemical/mechanical analysis, and 2D materials.
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